TR8100LV為德律科技最高階之電測設備，專為大型且復雜的電路板且低電壓測試所設計。TR8100LV的真空系統可確保全部針點良好接觸性，非多工式驅動/接收式數位結構,可達3,584點，針對多針點之元件測試更快更簡易且制作程序更快。TRI ToggleScan?測試技術結合邊界掃描提供少量或無測試點之解決方案。
? 1:1 驅動/接收數字結構
? 高測試覆蓋率
? 低電壓元件測試能力與超高檢測速度
? 人性化界面包含快速與簡單的程序設定
Tester Specifications
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Analog/hybrid test points
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TR8100LV: 3584
TR8100LLV: 5632
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Operating System
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Microsoft® Windows compatible PC with USB, Windows 7-10
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Fixture Type
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Offline press or vacuum type fixture
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Standard Testing Components
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Analog Test Hardware
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6-wire measurement switching matrix
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Programmable AC/DC/DC High voltage and current sources
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AC/DC voltage, DC current measurement, frequency
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Component R/L/C measurement
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Synthesized Arbitrary Waveform Generator
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TestJet vectorless open circuit detection
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Digital Testing
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Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
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DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A
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On-board Flash, EEPROM, MAC programming
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Optional Components
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Analog Hardware
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Fixture Conversion Kits for Teradyne, GenRad
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Digital Testing
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Programmable DUT power supplies: 75 V / 8 A, 200W maximum output power
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Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
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Yield Management System
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YMS 4.0
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Dimensions
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WxDxH
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TR8100LV: 1150 x 850 x 830 mm
TR8100LLV: 1550 x 850 x 830 mm
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Weight
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TR8100LV: 390 kg
TR8100LLV: 450 kg
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地址： 深圳市寶安區松崗街道東方社區大田洋南一路1號2棟301
郵箱：szdrtest@szdrtest.com
電話：0755-27054139
